Forensic Materials Analysis and Trace Evidence Characterization

The Phenom ParticleX GSR Desktop SEM system is purpose-built for automated gunshot residue analysis. It integrates SEM imaging and elemental analysis with automated particle detection and classification workflows, enabling consistent and unbiased identification of GSR particles. Its compact design, high level of automation, and reproducible workflows make it well suited for forensic laboratories handling routine casework with demanding turnaround requirements.

Techniques

• Elemental analysis

• Particle and inclusion analysis

Primary forensic applications

• Gunshot residue detection and classification

• Automated particle analysis

• Trace particulate evidence examination 

X-ray Photoelectron Spectroscopy provides highly surface-sensitive chemical analysis for forensic investigations where trace residues, thin films, and surface contamination are critical. XPS identifies elemental composition and chemical bonding within the top nanometers of a surface, enabling differentiation of polymers, tapes, coatings, corrosion products, and transferred materials.

In forensic workflows, XPS complements SEM-based particle analysis by adding chemical-state information that cannot be obtained from morphology or bulk elemental analysis alone. This combined approach strengthens evidential interpretation and supports more comprehensive forensic conclusions.

Techniques

• Comparative surface chemistry analysis

Forensics use cases

• Trace residue and contamination analysis

• Polymer, tape, and coating characterization