Electron Microscopy Resources

Real-world research featuring Thermo Scientific instruments

Explore the resources below to see what scientists and researchers have accomplished with Thermo Scientific instruments and software.

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Proposal of Tilt-axis Adjustment in V-NAND Plan-view without Si Substrate Using Automated Metrology of Transmission Electron Microscope

The Influence of Temperature on Photoresist Profiles during TEM Sample Preparation using Cryo-FIB

Advanced Axis Correction for Automated Workflow of Vertical Scanning Electron Microscopy Applications

Large Area Imaging for Metrology with High Accuracy Using Scanning Electron Microscope

(NEED LINK) Metrology analysis method of unique technique using low pixel resolution image for 3D NAND

(NEED LINK) Denoising of backscattered electrons image via U-Net convolutional neural networks for high quality 3D tomography of Ni-based oxide cathode secondary particles

PFIB Delayering– Nanoprobing Workflow on 5nm FinFET device

Abbreviated tomography techniques for quick correction of slides in 3-Dimensional NAND flash architectures

(NEED LINK) Application of Large Area Imaging for Metrology with high throughput using SEM

Eco-friendly natural mineral biotite as a cesium adsorbent: Utilizing low-concentration acid and hydrogen peroxide

New strategy to improve the accuracy of quantitative analysis of energy dispersive spectroscopy

A New Delayering Application Workflow in Advanced 5nm Technology Device with Xenon Plasma Focus Ion Beam Microscopy

Automated Metrology on the verticality of Cross-sectioned channel hole at VNAND with over 200 layers by Transmission Electron microscope

Automated cell layer counting and marking at target layer of 3D NAND TEM samples by Focused Ion Beam

Automated sample depth targeting with low kV cleaning by Focused Ion Beam Microscopy for Atom Probe Tomography

Ga Aggregation in Cu Layer on In-Situ TEM Analysis: Observation and Alternative Solutions

For Research Use Only. Not for use in diagnostic procedures.