Evolution™ 300 UV-Vis Spectrophotometer
Evolution™ 300 UV-Vis Spectrophotometer
Thermo Scientific™

Evolution™ 300 UV-Vis Spectrophotometer

This product is discontinued. Please see the newest model, the Thermo Scientific™ Evolution™ 350 UV-Vis Spectrophotometer.
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Catalog NumberType
10300201300 PC w/VisionPro Software
Catalog number 10300201
Price (CNY)
-
Type:
300 PC w/VisionPro Software

This product is discontinued. Please see the newest model, Thermo Scientific™ Evolution™ 350 UV-Vis Spectrophotometer.

A newer version of this product has been released - see the Evolution 350 Spectrophotometer.

Specifications
Accuracy±0.004 A at 1 A, ±0.004 A at 2 A, ±0.006A at 3 A
Baseline Flatness±0.0015 A, 200 to 800 nm, 2.0 nm SBW, smoothed
Certifications/Compliance21 CFR Part 11 and audit-proof IQ/OQ/PQ documentation. ISO 9001:2000
ConnectionsRS-232
Depth (English)21 in.
Depth (Metric)53 cm
Drift<0.0005 A/hr., 500 nm, 2.0 nm SBW, 2 hr. warmup
Electrical Requirements100/240 V, 50/60 Hz
For Use With (Application)Spectroscopy Elemental Isotope Analysis
Height (English)15 in.
Height (Metric)38 cm
Hertz50/60 Hz
HoldsCuvettes up to 100 mm
IncludesVisionSecurity Software, User Guide and USB Cable
InterfaceComputer Control
Lamp Life>5 years or longer if not using live signal
Min. Data Interval0.5 nm
MonochromatorModified Ebert
Noise

Photometric:

0A: <0.00018 A

1A: <0.00022 A

2A: <0.00050 A

500 nm, 2.0 nm SBW, RMS

Optical Design

Modified Ebert

Double beam with sample and reference cuvette/accessory positions

Pharmacopoeia Compliance Testing

Resolution (Toluene in Hexane): Peak/Trough Ratio >2.0

Photometric Accuracy (60mg/L K2Cr2O7): <±0.01 A relative to calibrated sealed standard

Stray Light: <0.13 %T at 198 nm with KCl per EP

220 nm: <0.01%T NaI (behaves identically to KI for USP)

Wavelength Accuracy: ±0.20 nm (546.11 nm Hg emission line), ±0.30 nm 190–900 nm

Wavelength Repeatability: Peak separation of repetitive scanning of Hg line source <0.10 nm

Photometric Accuracy Including Standard Tolerance

1A: ±0.008 A

2A: ±0.010 A

3A: ±0.018 A

Photometric Display±6 A
Photometric Range>4A
Photometric ReadoutAbsorbance, % Transmittance, % Reflectance, Concentration
Photometric Repeatability1 A: ±0.0025 A
Resolution (Toluene/Hexane)Peak/Trough >2.0 at 0.5 nm SBW
Scan Ordinate ModesAbsorbance, % Transmittance, % Reflectance, Concentration,
1st-4th Derivative
Scan Speed1 to 3800 nm/min.
Stray Light

198 nm: 2.9 A KCl

220 nm: 4.2 A NaI

340 nm: 4.3 A NaNO2

System RequirementsAt least Windows XP
Warranty3-year Source Replacement Warranty
Wavelength Accuracy±0.20 nm (546.11 nm Hg emission line); ±0.3 nm for 190 to 900 nm
Wavelength Data Interval10, 5, 2, 1, 0.5, 0.2, 0.1, 0.05 nm
Wavelength RepeatabilityStandard deviation of 10 measurements <0.05 nm
Weight (English)48.4 lb.
Weight (Metric)22 kg
Width (English)24 in.
Width (Metric)61 cm
Detector TypeDual Matched Silicon Photodiodes
Product LineEvolution 300
Spectral BandwidthVariable 0.5; 1.0; 1.5; 2.0; 4.0 nm
Type300 PC w/VisionPro Software
Voltage100/240 V
Wavelength Range190 to 1100 nm
Unit SizeEach