Get ready for ECASIA 2024

We are excited to sponsor the European Conference on Applications of Surface and Interface Analysis (ECASIA), which takes place in the beautiful city of Gothenburg, Sweden, from June 9 to 14, 2024.

If you’re planning to attend, be sure to catch our surface analysis presentations and book an appointment with our team to discuss how the latest techniques can support your work.

• See how your peers are using X-ray photoelectron spectroscopy technology to measure the elemental composition, electronic state, and chemical state of their samples
• Learn more about our new Correlative Imaging and Surface Analysis Workflow, which combines XPS technologies with a desktop scanning electron microscope
• Discover how XPS can help you analyze your most challenging samples, including microcircuits, ultra-thin films, barrier layers, lubricants, plastics/coatings, fibers, battery components, metals, and more

• Correlative Small Feature Analysis with XPS: Surface Contamination and Damage of FIB-SEM lamellae, presented by Miroslav Michlíček
• Non-Destructive Depth Differentiated Analysis of Surfaces Using Ion Scattering Spectroscopy (ISS), XPS and HAXPES, presented by Paul Mack
• Correlative XPS & SEM Analysis to Determine 2D Material Structures, presented by Tim Nunney
• Femtosecond Laser Ablation (fs-LA) – A New Approach to XPS Depth Profiling, presented by Dr. Mark Baker

Tackle your surface analysis challenges with help from our XPS learning center.