The Australian Centre for Microscopy and Microanalysis at the University of Sydney and Thermo Fisher Scientific invite you to a workshop using multi-ion source plasma FIB technology and extreme high-resolution imaging with the Thermo Scientific™ Helios Hydra DualBeam.
The combination of focused ion beams and scanning electron microscopes (FIB/SEM) has enabled access to microstructural information at and below the surface in 3D, micro-fabrication and S/TEM sample preparation. Until recently, the available technologies have limited the volumes and depths of materials that can be analyzed at high resolution, ultimately restricting insight into structural, crystallographic and chemical properties. This is no longer the case.
Plasma FIB (PFIB) technology offers access to regions of interest deep below the surface, combining serial section tomography with statistically relevant data analysis. PFIB technology offers an alternative ion species for FIB milling and increased milling rates because of its ability to deliver 30–40 times more current compared to Ga+ FIBs. Nowadays, new column and source technologies allow for multiple ion species to be employed for sputtering at high- and low-accelerating voltages, so that you can tailor the choice of ion to achieve the best quality thin section for HR-STEM.
