TEM Tomography
In order to reveal the true nature of many specimens, you must study their third dimension. TEM Tomography is a technique in which images are recorded from a specimen in as many orientations as possible. These images are then back-projected to visualize and analyze the 3D structure with high fidelity. To collect tomography data “tilt-series”, Thermo Scientific™ TEM tomography acquisition software tilts the specimen, controls the specimen and stage movements to ensure the area of interest stays centered, focuses, and then records the image in an automated fashion. Improvements to the tomography acquisition software make it easier to use than ever. It also gives you the flexibility to seamlessly collect data on a wide range of samples both at room temperature and in cryo conditions. In this workshop, we will explore the embedding of the software within the TEM user interface and demonstrate its simplicity as well as its robustness.

STEM Tomography + EDS Tomography
Electron tomography is a technique for recording images at various alpha tilts and then back-projecting them into a 3D reconstruction. Thermo Scientific™ Tomography 4.0 Software makes collecting data easier and more efficient. In this workshop, we will demonstrate how to set up and acquire STEM tomograms using this software. We will also show the automated EDS tomography function using a combination of Tomography 4 Software and Thermo Scientific™ Velox™ Software.

3D Datasets with Inspect 3D, Avizo and Amira Software
At Thermo Fisher Scientific, we believe that the path to success for our customers lies in the intelligent integration of hardware and software. As an extension to our powerful and already popular tomography acquisition software, we have integrated tile series post-processing into our updated suites of Thermo Scientific™ Inspect3D™, Amira™ and Avizo™ Software. This 3D post-processing and visualization integration is unique in the electron microscopy world. It enables you to obtain quantitative data quickly and seamlessly. In this workshop, we will investigate this integration and demonstrate its simplicity on a real-world tomography project acquired during the users’ meeting. We will show segmentation strategies for this data set and demonstrate how to obtain quantitative results.

Maps Software for TEM with EDS 
Thermo Scientific™ Maps™ Software is an automation and correlative workflow software suite for Thermo Scientific SEM, TEM and DualBeam™ platforms. As part of the operation workflow, Maps Software allows you to easily and automatically acquire large 2D mosaic datasets. As part of an inspection workflow, Maps Software allows you to inspect the complete sample in more detail by combining information from multiple modalities. With the addition of EDS data incorporation, Maps Software can function as a tool for statistical analysis as well. In this workshop, we will demonstrate Maps Software with EDS acquisition at various magnifications, and we will also show correlation with light microscopy (LM) data.

Intro To Cryo-EM with Talos L120C TEM and the Vitrobot System
Interest in structural biology techniques such as automated single particle analysis (SPA) by cryo-electron microscopy (cryo-EM) and cryo-electron tomography (cryo-ET) have skyrocketed in the past few years. The Thermo Scientific™ Krios™ G3i and Glacios™ Cryo-Transmission Electron Microscopes (Cryo-TEMs) enable life sciences researchers to unravel life at the molecular level—easier, faster and more reliably than ever before. This session will be aimed at demonstrating the SPA workflow by loading samples into a Glacios Cryo-TEM 200 kV autoloader system and set up an automated data collection session using a Thermo Scientific™ Falcon™ 3EC Direct Electron Detector controlled by Thermo Scientific™ EPU™ Software, our solution for automated SPA data acquisition.

MicroED
MicroED (Micro Electron Diffraction) is a novel technique that can provide high-resolution structure determination from 3D sub-micron crystals. It can provide high-resolution protein structure determination to <2 Å and organic molecule structure determination to <1 Å under cryo-TEM conditions. Here, we present a procedure that demonstrates key steps in the fast acquisition of MicroED datasets by combining the techniques of electron diffraction, ultra-fast TEM tomography and cryo-TEM.

Advanced TEM Operation
The ability to identify and correct the optical misalignment of a TEM is crucial for capturing high-resolution S/TEM images. In this session, we will demonstrate the daily alignment procedure for HR-TEM and HRSTEM imaging and how to correct two-fold condenser stigmatism using Ronchigram as a reference. We will also show how to acquire diffraction patterns (CBED, SAED) on Thermo Scientific Ceta cameras.

In situ TEM
Because they provide valuable information on dynamic processes, in situ imaging and chemical analysis in TEMs have been attracting lots of interest. In this workshop, we will demonstrate how to load your sample onto a Thermo Scientific MEMS heating holder and how to image the sample at various temperatures.

Automated TEM image acquisition, EDS with DualX and Metrology
Computer automation has become a crucial processing component within the semiconductor industry, from processing of the wafers to transportation of FOUPs. However, TEM analysis of the devices on these wafers has typically been performed manually, which requires an experienced TEM engineer to set up all of the proper imaging conditions and then acquire each image. Then, all of the critical dimensions from each TEM image would need to be manually obtained. Obviously, this entire process can be quite tedious and cumbersome. Recently, Thermo Fisher Scientific developed a new workflow process and tools to fully automate TEM sample preparation and analysis. In this workshop, we will demonstrate automation functions using Recipe Editor, including the setup of eucentric height, focusing and estimating images, aligning the sample to a zone axis, and so on. We will go over the methodology used in tracking the region of interest and workflow of the recipes and show an automated run from beginning to end.

EELS
Electron energy loss spectrometry (EELS) is a widely used technique to determine the sample thickness, elemental composition, valance states, etc. In this workshop, we will demonstrate how to set up and acquire EELS data, including spot analysis, line profile and spectrum image. We will also demonstrate the data processing required to obtain the information from the raw data.

Strain Analysis
The nano beam diffraction (NBD) technique is used to obtain the 1D/2D strain analysis in a large field of view. In this technique, the diffraction patterns along a line or within an area are acquired in microprobe STEM mode. The data are then analyzed using the offline software, Thermo Scientific™ Epsilon Strain Analysis Software, to automatically generate a plot of the strain profile across the acquired line scan or strain map within a scanned area. In this workshop, we will show the μpSTEM alignment procedure and how to set up experiments to acquire diffraction patterns either along a line or within an area. We will also show how to analyze the results using Epsilon Software.

Intro Corrected STEM: HRSTEM Imaging with Unified DCOR
Reproducibility of the aberration correction in STEM often depends on the skillset of the user. High-order aberrations are stable for a longer duration of time and can be well-aligned in the corrector user interface. While high-order aberrations are robust, low-order aberrations, such as three-fold astigmatism and beam tilt, possess very poor stability and very short durations. These often depend on the ability of the user to correct them manually by interpreting the Ronchigram for each sample, which has limited accuracy. We will demonstrate a new aberration-correction algorithm that consistently tunes defocus, two-fold astigmatism, three-fold astigmatism and beam tilt independent of the sample analyzed, resulting in ultimate STEM imaging performance for every sample.

Advanced Corrected STEM: HRSTEM Imaging with S-CORR
The new Thermo Scientific aberration corrector is a fifth-order aberration corrector of the probe forming lens. S-CORR provides a guaranteed sub-Angstrom resolution at 80 kV and 60 kV STEM imaging. In this session, we will demonstrate the performance of this third-generation probe aberration corrector in the imaging of beam-sensitive materials. We will show how its monochromator provides high-energy resolution combined with the benefits of reduced Cc in STEM imaging. Additionally, we will demonstrate the use of a <0.2 eV energy resolution probe in characterization of the chemical state in materials.

iDPC
We will combine the probe performance of probe-corrected Thermo Scientific™ Themis™ TEM with a new center of mass imaging (COM) technique using a segmented dark field detector. This technique, which is called integrated differential phase contrast (iDPC) imaging, allows the imaging of light atomic columns with higher signal-to-noise ratio than does the annular bright field (ABF) technique.