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Americas: June 24, 11am PST
APAC: June 25, 9am CST
Europe: June 25, 3pm CEST
As AI, HPC, and advanced semiconductor devices push current demands higher, traditional latch-up testing struggles to deliver the speed, control, and accuracy required, leading to longer test times and uncertain results.
In this live webinar, our experts will break down how to approach high-current latch-up testing with confidence, including how hybrid power supply solutions enable more precise and efficient validation.
Drawing from real-world applications and customer experience, this session will provide practical insights you can apply immediately, along with a roadmap for what equipment you need to consider.
What you’ll learn
- How high-current latch-up testing differs from standard approaches
- How to meet JESD78 requirements with greater efficiency and accuracy
- Lessons learned from real-world implementations
Grounded in proven methodologies, these insights reflect the growing need for integrated, high-current-capable test solutions as device complexity increases.
Why you should attend
- Reduce false positives and missed latch-up events
- Shorten test times compared to traditional setups
- Gain practical guidance from experienced applications engineers
- Understand how to scale your existing platform with hybrid power solutions
Real-world deployments have shown that integrated hybrid supply approaches can dramatically reduce test time and improve compliance with industry standards, compared to less optimized setups.
Who should attend
- Reliability and validation engineers working with high-current devices
- Teams developing AI, HPC, or advanced semiconductor technologies
- Anyone responsible for latch-up or EOS qualification
Learn how to improve accuracy, reduce test time, and confidently validate high-current devices.
About the speakers
Tom Meuse
Applications Engineer
Thermo Fisher Scientific
Tom Meuse is an Applications/Product/Technology Engineer for Compliance Test Solutions, located in Tewksbury MA, USA. He is responsible for the Thermo Scientific ESD and Latch-Up Test System operations. Tom is a member of the ESD Association Device Testing (WG-5.x) committees, the Joint ESDA/JEDEC Device Testing work groups, chair of WG14, and he is a member of the JEDEC JC-14.1 Committee on Reliability Test Methods. He is a contributing member of the Industry Council on ESD Target Levels. He is also on the Board of Directors for both the National and the Northeast Chapters of the ESD Association.
Marcos Hernandez
Senior R&D Manager
Thermo Fisher Scientific
Marcos Hernandez is the Senior R&D Manager for the Thermo Scientific ESD line of products, and he is located in Tewksbury, MA. Thermo Fisher produces ESD test equipment for EMC, HBM, MM, CDM, TLP, and latch-up verification. A former member of the JEDEC JESD 14.1 working group and current member of the ESDA HBM/JEDEC joint working group, CDM and MM, before his position at Thermo Fisher, he has worked at Oryx Instruments as a senior systems engineer, PRI Automation as an engineering consultant, and Process Diagnostics in Sunnyvale, CA, as the Senior Systems Engineer for the production of ion implanter optical monitors. He holds multiple patents in the areas of ESD and measurement, including a patent for a mercury substitute in relays. Marcos was a full-time electronics and semiconductor manufacturing professor at San Jose City College for nine years and received a BS degree in Chemical Engineering from the University of Guanajuato, Mexico.
Frank di Cesare
Software Engineer
Thermo Fisher Scientific
Frank Snyder Di Cesare is a Software Engineer in Compliance Test Solutions. He has been with Thermo Fisher for over 30 years, where he develops software for ESD and latch-up testers. He previously designed embedded software for EMC test equipment. Before joining Thermo Fisher, he worked as an electrical engineer creating analog and digital solutions, as well as software, for companies in the semiconductor test equipment and scientific instrumentation industries. He holds a BS in Electrical Engineering from Cornell University.