Scientific Poster

Hard X-ray Photoelectron Spectroscopy for Multi-Layer Semiconductor Samples

Hard X-ray Photoelectron Spectroscopy for Multi-Layer Semiconductor Samples

Presentation

Monatomic and Cluster Argon Ion XPS Depth Profiling of SrTiO3 and HfO2

Hard X-ray Photoelectron Spectroscopy for Multi-Layer Semiconductor Samples

Presentation

Design of Integrated XPS/Raman Spectroscopy Instrument for Co-Incident Analysis

The Design of An Integrated XPS/ Raman Spectroscopy Instrument for Co-Incident Analysis