Phenom ParticleX Desktop SEM

Automate your industrial quality control with electron microscopy and integrated EDS analysis

Are you looking for an automated quality control tool that helps you solve your particle analysis challenges faster and more efficiently—with highly trustworthy results?

 

If you currently use a particle size analyzer or optical microscope for particle analysis but need to raise your game, then you might be surprised at what our Thermo Scientific Phenom ParticleX Desktop Scanning Electron Microscopes (SEMs) can achieve.

 

First and foremost, they deliver fast identification and classification of particles at the microscale in various applications, including additive manufacturing materials, technical cleanliness, steel, battery cathode powder, and gunshot residue.

 

What truly differentiates our Phenom ParticleX Desktop SEMs is the integrated Thermo Scientific Perception Automation Particle Analysis Software. It accelerates throughput and enables you to turn raw data into actionable—and unbiased—answers. With its advanced automation features, this solution delivers concise, impartial industrial reports for you and your team.

 

Coupled with this is Thermo Scientific ChemiSEM Technology, our integrated energy-dispersive X-ray spectroscopy (EDS), which gives you the freedom to conduct complex compositional analysis via one single, simple process, eliminating the need for time-consuming switching between different systems.

Microscale particle analysis with Phenom ParticleX Desktop SEM

Phenom ParticleX Desktop SEM overview

Phenom ParticleX AM Desktop SEM for additive manufacturing

If you want to step up the quality and precision of your additive powder testing with more detailed analysis and accurate size measurements, then this system is an ideal choice. It also accelerates your throughput, with the ability to load up to 49 samples simultaneously.

Phenom ParticleX TC Desktop SEM for technical cleanliness

Compared to traditional optical microscopes, our Phenom ParticleX TC Desktop SEM not only enables you to conduct more detailed compositional analysis at the microscale but also allows you to reliably detect and analyze translucent particles, such as glass, that are often missed by other systems.

Phenom ParticleX Steel Desktop SEM for metal cleanliness

As the name suggests, this system is ideal for steel. With its automated functions, it helps you meet ever-stringent industrial quality standards by conducting compositional failure analysis of steel at the nanoparticle level, both during its production and in its finished form (for example, gear wheels).

Phenom ParticleX Battery Desktop SEM for battery impurity analysis

This compact system delivers a throughput that’s up to 10 times faster than any other automated quality control SEM on the market. Now you can analyze up to 49 samples simultaneously at the microscale, helping to ensure that even the smallest impurities are detected.

Phenom ParticleX GSR Desktop SEM for gunshot residue analysis

The only system custom-designed for gunshot residue (GSR) analysis on the market, the Phenom ParticleX GSR Desktop SEM gives you particle analysis at the microscale. And it does so at lighting speed. In fact, a sample that might have taken four hours to analyze using conventional SEMs can take as little as 15 minutes with this system. 

Phenom ParticleX Desktop SEM Learning Center

Would you like to know more about the Phenom ParticleX Desktop SEM series? Dive into a wealth of resources, from e-books to datasheets.

For Research Use Only. Not for use in diagnostic procedures.