Introducing the Scios 3 FIB-SEM for advanced materials characterization

Automated workflows and analytic capabilities for efficient sample preparation and analysis


On-demand webinar 

Duration: 38 minutes + QA


Join us as we introduce the new Thermo Scientific Scios 3 FIB-SEM and be the first to see how its innovative features and technologies can help you accelerate your materials characterization workflow. 

In this webinar, you will: 

  • Discover how the Scios 3 FIB-SEM’s reliable and automated workflows not only increase efficiency for routine tasks but also elevate quality control and failure analysis processes

  • Learn about new automation workflows that focus on non-EM users, remove the complexity of FIB milling, optimize tool use, and ensure no tool time is wasted

  • See how the Scios 3 FIB-SEM is optimized for cross-sectioning and excels in routine FIB tasks such as sample preparation and 3D analysis

  • Explore how this tool can meet your future application needs with high-resolution imaging, the flexibility to analyze different materials, and the opportunity to add analytics
     

About the speaker

Anna Prokhodtseva, Product Marketing Manager, Thermo Fisher Scientific

Anna holds a PhD in physics from EPFL in Lausanne, Switzerland, where she used TEM and FIB techniques to study radiation damage in Fe and FeCr alloys for fusion energy applications. She joined Thermo Fisher Scientific in 2017 as an SEM and FIB-SEM applications specialist in Brno and later moved to Eindhoven as a product specialist for SEM, SDB, and micro-CT. Since 2022, she has focused on software development for FIB-SEM systems and currently serves as product marketing manager for Thermo Scientific FIB-SEM instruments.

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