Search
On-demand webinar
Duration: 1 hour 3 minutes
Join this live webinar to learn how the Thermo Scientific Talos TEM and Thermo Scientific Velox Software can help you efficiently acquire high-quality data across a range of applications.
You’ll get a short introduction to the most used TEM and STEM techniques along with practical guidance on how to collect optimal data and interpret your results with confidence.
In this webinar, you will:
Gain an overview of essential imaging, diffraction, and EDS techniques
Learn practical steps to acquire high-quality, reliable data
Discover optimized workflows to guide you toward the best results for your samples
Host
Dr. Julie Marie Bekkevold, TEM Product Specialist, Thermo Fisher Scientific
Julie has expertise in transmission and scanning transmission electron microscopy (TEM/STEM), including advanced techniques such as 4D STEM. She previously conducted PhD research at Trinity College Dublin, where she focused on advanced STEM imaging and simulations for nanoscale material characterization, including low-dose techniques to minimize beam damage and computational approaches to correlate experimental and simulated data. Julie is actively engaged in the microscopy community, having presented at international conferences and contributed to the advancement of quantitative microscopy methods. She combines strong technical knowledge with practical experience to help researchers achieve high-quality imaging and analytical results.
Demonstrator
Dr. Xiaowei Jin, TEM Applications Scientist, Thermo Fisher Scientific
Xiaowei has a strong background in TEM and materials science, with both his PhD and postdoctoral research focused on electron microscopy–based materials characterization. He specializes in key TEM techniques, including TEM, SAED, STEM, and EDS, and is dedicated to helping users quickly gain practical skills and confidence in operating Talos TEMs.