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9 December 2025
12 p.m. CET
When using cryo-electron microscopy to image cells and tissue at high resolution, samples must be thinned to 500 nm or less to ensure electron transparency. Focused ion beam (FIB) milling has become the standard method to prepare thin samples (lamellae), but other sample preparation methods can contribute valuable complementary insights.
In this webinar, Professor Benoît Zuber of the University of Bern, Switzerland, will discuss a preparation technique called cryo-electron microscopy of vitreous sections, or CEMOVIS, in which thin sections are cut with a knife. While CEMOVIS sections sustain damage, they can be sectioned in series, producing many orders of magnitude more imageable area than usual for PFIB. Plus, many regions of the sections contain intact molecular structures for comparison, making it possible to place results from cryo-lamellae into the wider cellular context.
Join this webinar to:
- Discover how Professor Zuber was able to obtain high-resolution reconstructions from CEMOVIS sections
- See how the sections keep molecular structures intact in many regions despite damage from the technique
- Learn how complementary techniques can help place cryo-lamellae in the wider cellular context
About the speaker
Benoît Zuber, Professor, Institute of Anatomy at the University of Bern
Benoît Zuber is a professor at the Institute of Anatomy at the University of Bern, where his team studies synapses and bacterial pore-forming toxins using cryo-electron microscopy and tomography. He has over two decades of expertise in CEMOVIS, focusing on high-resolution structural studies of native cellular environments. His work bridges methodological development and biological application to push the limits of in situ imaging.