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November 24, from 12:00 to 18:00,
followed by dinner
November 25, from 8:45 to 13:30,
followed by lunch and facility tours
Join us for our third annual failure analysis seminar—now reimagined as RISE: Revolutionary Innovations for Semiconductor Excellence, reflecting an elevated and more impactful experience.
This year, we are excited to welcome even more guest speakers from the semiconductor industry. Don’t miss the latest work shaping failure analysis workflows across technologies.
RISE Europe 2026 brings together engineers across the semiconductor industry to explore how vendors and laboratories are collaborating to generate more meaningful data and support a broader range of applications. The seminar also highlights key capabilities that can help advance failure analysis workflows.
Attend this two-day, in-person seminar for the opportunity to network with our experts and your peers:
- Learn how electrical to physical analysis workflows with advanced capabilities are executed.
- Discover how applications development can improve the data you get from your instrumentation.
- Watch live demonstrations of enhanced analytical capabilities and features that can streamline your work.
Who should attend?
Engineers executing and relying on data from the failure analysis and characterization of semiconductor devices and materials using electrical, optical, and electron optical analysis instruments.
Thijs Kempers, CEO, Eurofins MASER
Renald Dechino, Sr. Failure Analysis Engineer, Ampleon BV
Rik Otte, Technical Staff, Failure Analysis, NXP Semiconductors
Dr. Kris Paulussen, Title, imec
Ya-Shan Peng, Sr. R&D process engineer, JIACO Instruments
Dr. Johan Verbeeck, Professor, EMAT lab, University of Antwerp
Dr. Letian Li, Sr. Product Specialist, Thermo Fisher Scientific
Antoine Reverdy, Applications Engineer, Sector Technologies
Karolina Fichtova, Sr. Product Marketing Manager, Thermo Fisher Scientific
Libor Strakos, Senior Manager, Product Marketing, Thermo Fisher Scientific
Dr. Ondrej Baco, Product Manager, Thermo Fisher Scientific
Martin Schneider, Sr. Product Marketing Manager, Thermo Fisher Scientific
12:00 - Arrival + refreshments
12:20 - Seminar welcome
Technical Session: Sample Preparation
12:40 - Invited topic with JIACO Instruments
13:10 - Invited topic with NXP Semiconductors
13:40 - Demonstration: Sample Preparation
14:20 - Break + refreshments
Technical Session: TEM Preparation
14:40 - Plasma-FIB Sample Preparation
15:10 - Ga-FIB Sample Preparation
15:40 - Invited topic with imec
16:10 - Break + refreshments
Technical Session: TEM Analysis
16:30 - TEM Analysis
17:00 - Invited Topic with EMAT - University of Antwerp
17:30 - Live Demonstration: Iliad (S)TEM EELS
18:00 - Networking dinner
8:45 - Arrival + refreshments
Technical Session: Fault Isolation & Failure Analysis - Part 1
9:00 - Lock-in Thermography
9:30 - Invited topic with NXP Semiconductors
10:00 - Invited topic
10:30 - Break + refreshments
Technical Session: Fault Isolation & Failure Analysis - Part 2
10:50 - Optical Fault Isolation
11:20 - Live Demonstration: Optical Fault Isolation
11:50 - Invited topic
12:10 - Invited topic with Ampleon
12:20 - Seminar wrap-up
12:30 - Networking lunch
Tours & Instrument Demonstrations
13:30 - Facility tour
14:20 - Live Demonstration (Optional): Helios PFIB-SEM System
14:40 - Live Demonstration (Optional): Centrios Circuit Edit System
Recommended nearby hotels:
What will you learn?
A complete failure analysis workflow requires multiple disciplines and expertise. Increase the depth of your knowledge of electrical fault localization, optical fault isolation, focused ion beam circuit editing and sample preparation, and advanced electron microscopy. At the same time, gather context beyond your area of focus, including the analysis that comes before and after your work, and the critical components of increased connectivity and efficiency.
Why attend in person?
Networking, collaboration, and organic discussion are best achieved in a face-to-face environment. While we encourage attending large-scale conferences as well, we believe that focused seminars can offer more tailored material and in-depth engagements. You will also tour Eurofins MASER’s extensive facility, offering valuable perspective on the tools and experience needed for full-scale reliability testing and failure analysis.
What if my organization isn’t planning to invest in instrumentation?
Whether your failure analysis is sourced externally or you have plans to introduce a new system to your lab, this seminar will provide valuable insight on how to get more complete data from the resources you have and help identify what capabilities you may need. We will cover expanded use-cases and techniques for both electrical and physical analysis, to give you the comprehensive understanding and context to make decisions and improve your results.
What expenses are required?
The seminar is free to registrants and includes a networking dinner and lunch over the two-day schedule. The agenda is set over one afternoon and one morning to allow for same-day travel and potentially only one night of accommodation, reducing overall cost.