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On-demand webinar
Duration: 20 minutes + QA
Demand for efficient, connected devices is driving technology developments industry-wide. Researchers and engineers need reliable and rapid analysis of varying materials, device structures, and nanoscale faults, which TEM resolution can deliver.
The Thermo Scientific Talos F200E (S)TEM provides high-resolution, high-contrast S/TEM imaging with low distortion and a range of detection options. However, the usefulness of this workhorse platform goes far beyond imaging.
Watch our live webinar to understand the powerful scope of analytical capabilities and key enablers of high-throughput, repeatable analysis for semiconductor use cases, including elemental, grain, and dopant mapping.
Some examples we will cover:
- When is it best to use STEM over TEM mode for analysis?
- What are the benefits of simultaneous EDS and EELs?
- How is differential phase contrast used?
- What component specifications are most important for different types of analysis?
Register now and get your questions answered live.
About the speaker
Martin Schneider, Product Marketing Specialist, Thermo Fisher Scientific
Martin is a Product Marketing Specialist overseeing the semiconductor-optimized Talos F200E (S)TEM. He began his career at Thermo Fisher as an optical expert, concentrating on reducing image distortions and enhancing magnification calibration accuracy in our (S)TEM systems. Before joining the organization, Martin studied Physical Engineering and Nanotechnology at Brno University of Technology. He has a strong passion for innovation and cutting-edge technology, with extensive expertise in high-resolution (S)TEM, EDS, and advanced 4D STEM techniques.