Semiconductor Analysis Solutions

REVEAL what matters | ENABLE what's critical | INNOVATE what's next

Reveal hidden insights with atomic-scale accuracy through semiconductor-focused electron microscopy for faster root cause identification and metrology. Enable advanced processes with automation that improves yields and enhances productivity, proven by our large global installed base. Innovate with end-to-end workflows that deliver ground truth analysis for next generation semiconductor production.

See beyond the surface. Gain the competitive edge.

Advanced electrical and physical analysis solutions for next-level semiconductor technologies

Discover our advanced electrical and physical analysis solutions designed to progress next-level semiconductor technologies. Our comprehensive offerings provide insights that conventional techniques often miss, enabling atomic-scale accuracy for precise ground truth in complex structures. This empowers semiconductor lab and fab engineers to achieve remarkable root-cause analysis, improved yield, and quicker time to market. With over 40 years of expertise and responsive support, we are among the leaders in complete end-to-end workflow solutions. Trust us as your partner when seeing beyond the surface makes all the difference.

Semiconductor solutions for improved performance

Lab Automation solutions

Streamline data collection between the lab and the fab. Learn how our integrated TEM metrology workflow is poised to revolutionize TEM lab automation.

Fab Automation solutions

Discover how our fab automated solutions accelerate access to critical data by placing systems in the fab instead of the lab, enabling engineers to optimize process control, boost yield, and gain full ownership of their data by using fab systems engineered for quick process decisions.

Semiconductor-focused instruments

FIB-SEM instruments

FIB-SEM instruments provide accurate site-specific cross-section SEM or TEM sample preparation for detailed analysis of semiconductor devices.

TEM instruments

Atomic-resolution imaging and analysis of semiconductor devices enable manufacturers to calibrate toolsets, diagnose failure mechanisms, and optimize overall process yields.

SEM instruments

Scanning electron microscopy (SEM) analysis is a crucial tool used in the semiconductor industry. SEM has a wide range of applications and use cases to facilitate both metrology and defect analysis.

Electrical fault isolation instruments

Troubleshooting semiconductor device failures is crucial for enhancing manufacturing yield, lowering costs, and minimizing end-of-line test failures. Learn more about our semiconductor electrical failure analysis solutions.

Semiconductor Learning Center

On-demand SPARK webinars

For Research Use Only. Not for use in diagnostic procedures.