Axicon-based Bessel beams for flat-field illumination in total internal reflection fluorescence microscopy.
AuthorsSchreiber B, Elsayad K, Heinze KG
JournalOpt Lett
PubMed ID28957150
'Total internal reflection fluorescence microscopy (TIRF-M) provides low-invasive high-contrast surface imaging with optical sectioning of typically 100-200 nm. Thus, TIRF-M has become an established tool for imaging surfaces, including cell membranes. For TIRF-M, a homogenous evanescent field of excitation over the whole field of view is generally desired for quantitative microscopy; ... More