TEM | Talos F200i | Materials Science | Scanning Transmission Electron Microscope

Advanced S/TEM imaging and analytical performance for versatile research and industrial applications

The Thermo Scientific Talos F200i (S)TEM is a versatile 20–200 kV field emission scanning and transmission electron microscope designed for high performance and productivity across a wide range of materials science and semiconductor analysis applications. With its flexible objective lens gap and reproducible electron column, the Talos F200i (S)TEM enables high-resolution 2D and 3D characterization, in situ dynamic observations, and electron diffraction studies.

Talos F200i (S)TEM highlights:

20–200 kV field emission (S)TEM for broad analytical versatility
Compact design for easier facility integration and lower infrastructure cost
Flexible EDS options, including side-entry/retractable detectors with single or Dual-X configurations
Automated tuning and Align Genie software for reproducible setup and fast time-to-data
Thermo Scientific Velox Software interface shared across TEM platforms for fast learning curve
Remote operation and SmartCam Camera support for productivity in multi-user labs

Why choose the Talos F200i (S)TEM?

The Talos F200i (S)TEM delivers a powerful balance of performance, flexibility, and ease of use, making it an ideal choice for academic, industrial, and multi-discipline labs. Its design enables scientists and engineers to focus on results, not instrument complexity.

Key benefits:

Broad analytical capabilities—Designed to support high-resolution imaging, elemental mapping, and diffraction across a variety of sample types.
Flexible EDS options—Add side-entry retractable detectors, from single detectors to dual 100 mm² Dual-X configurations, for tailored chemical analysis.
Automated workflows—Velox Software and Align Genie automation simplify daily tunings and enhance reproducibility in multi-user environments.
Compact, productive design—The smaller footprint and smart camera support improved accessibility, uptime, and throughput.

Understanding the Talos (S)TEM portfolio

The Talos (S)TEM portfolio is designed to support a wide range of materials science and semiconductor analysis workflows, with each system optimized for different priorities. The Talos F200i (S)TEM focuses on productivity, flexibility, and ease of use, making it an ideal choice for multi-user laboratories and routine characterization. The Talos F200S (S)TEM builds on this foundation by adding enhanced analytical performance, improved environmental stability, and a clear upgrade path, offering an excellent balance between throughput and advanced capability. The Talos F200X (S)TEM represents the most advanced analytical platform in the family, delivering the highest EDS performance, fastest time to chemical insight, and superior 2D and 3D compositional analysis. Finally, the Talos F200E (S)TEM delivers a dedicated semiconductor analysis solution, also providing the most advanced analytical capabilities alongside low distortion optics for highly repeatable workflows and reliable measurements required for semiconductor devices. Together, the Talos (S)TEM systems provide scalable solutions that allow laboratories to choose the right level of performance today while retaining flexibility for future needs.

Learn more about the full Talos (S)TEM portfolio

Partnering in sustainability—ACT label

Understand your lab's environmental impact with the Talos F200i (S)TEM's ACT label. Created by My Green Lab, the ACT label sets the standard for determining the environmental impact of laboratory products and helps labs make informed, sustainable purchasing decisions.

Learn more about the ACT label

Talos F200i Scanning Transmission Electron Microscope features

EDS adaptability and analytical flexibility

Choose from a wide range of energy-dispersive X-ray spectroscopy (EDS) detector configurations to match your analytical needs. The Talos F200i (S)TEM supports single-detector setups as well as dual 100 mm² Dual-X EDS configurations, enabling optimized performance for both high-throughput elemental mapping and low-dose, beam-sensitive analysis. This flexibility allows you to tailor EDS performance for routine characterization, advanced materials research, or dynamic experiments without compromising data quality.

Available with a wide range of high-resolution field emission guns (FEG)

Select the electron source that best fits your application requirements. The Talos F200i (S)TEM is available with S-FEG, high-brightness X-FEG, or the ultra-high-brightness cold field emission gun (X-CFEG). The X-CFEG delivers exceptional probe brightness combined with outstanding energy resolution, enabling superior (S)TEM imaging and highly sensitive analytical measurements. This flexibility supports a broad spectrum of imaging and spectroscopy workflows, from routine analysis to advanced high-resolution studies.

High-quality STEM and TEM imaging with accurate EDS quantification

Acquire high-quality TEM and STEM images quickly and intuitively using the Velox Software user interface. Velox Software simplifies complex workflows while ensuring consistent results across users. Its unique EDS absorption correction enables highly accurate elemental quantification, even for challenging sample geometries, supporting confident materials characterization and reliable analytical conclusions.

Advanced all-round in situ and 3D capabilities

Expand your experimental possibilities with support for tomography and in situ sample holders. The Talos F200i (S)TEM combines fast cameras, intelligent software, and a wide X-TWIN objective lens gap to enable 3D imaging and in situ data acquisition with minimal compromise to spatial resolution or analytical performance. This makes it an excellent platform for studying dynamic processes and structural evolution in real time.

Increased productivity for multi-user environments

Designed for efficiency, the Talos F200i (S)TEM features an ultra-stable electron column, remote operation with the SmartCam Camera, and constant-power objective lenses. These capabilities allow rapid mode switching and high-tension (HT) changes, significantly reducing setup time. Fast, seamless transitions between imaging conditions improve throughput and make the system an ideal choice for shared and multi-user laboratories.

Highly repeatable and reproducible data

All critical daily TEM alignments and tunings, including focus, eucentric height, beam shift, condenser aperture, beam tilt pivot points, and rotation center, are fully automated. This ensures that every session begins from optimal imaging conditions, enabling experiments to be repeated with high reproducibility. You can spend less time on instrument setup and more time focusing on scientific insight and discovery.

Large field-of-view imaging at high speed

The 4k × 4k Ceta CMOS camera delivers a large field of view with high sensitivity and fast acquisition speeds across the full accelerating voltage range. Live digital zooming allows you to seamlessly move from overview imaging to fine structural detail, supporting efficient navigation and data collection without sacrificing image quality.

Compact design with reduced infrastructure demands

The Talos F200i (S)TEM features a compact footprint and optimized system dimensions, making it easier to install in space-constrained laboratories. The smaller system size helps reduce infrastructure, installation, and long-term support costs, while maintaining the performance and versatility expected from a high-end (S)TEM platform.

Talos F200i Scanning Transmission Electron Microscope specifications

TEM	Line resolution: ≤0.10 nm
Operating system XX units	Controller: Windows® 10 Remote controllable: Yes
Vacuum system	Airlock pumping: Oil- and vibration-free Cold trap: Standard Long-duration Dewar: Optional, at least 4 days stand-time (between refills)
STEM imaging	STEM resolution:   ≤0.16 nm (S-FEG/X-FEG) ≤0.14 nm with 100 pA (X-CFEG) Detectors: HAADF and/or on-axis Panther BF/DF
Energy dispersive X-ray spectroscopy (EDS)	Detector size (Bruker X-flash): 30, 100, or dual 100 mm² Retractable: Yes, motorized
Electron energy loss spectroscopy (EELS)	≤0.8 eV (S-FEG/X-FEG) ≤0.3 eV (X-CFEG)
Gun brightness 200 kV	4×10⁸ A /cm² srad (S-FEG) 1.8×10⁹ A /cm² srad (X-FEG) 2.4×10⁹ A /cm² srad (X-CFEG)

Talos F200i Scanning Transmission Electron Microscope resources

Velox Software and Talos (S)TEM: The power duo at your service

Watch this on-demand webinar to learn how Velox Software and the Talos (S)TEM can help you efficiently acquire various types of data from your samples, including TEM and STEM images, diffraction data, and EDS data. You’ll see how to use the tools in tandem to collect and accurately analyze data from multiple sample types.

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Talos F200i Scanning Transmission Electron Microscope documentation

Datasheet: Talos F200i (S)TEM for Materials Science

The Thermo Scientific Talos F200i (S)TEM is a field emission scanning transmission electron microscope designed for high-resolution imaging and analysis in materials science. Operating from 20–200 kV, it supports 2D and 3D characterization, diffraction, and in situ experiments. Integrated detectors, EDS capabilities, and Velox Software help enable precise, high-throughput data collection. Its stable column, wide pole piece gap, and automated workflows help improve reproducibility and ease of use across multi-user labs, while a compact design helps reduce infrastructure demands.

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Brochure: Talos (S)TEM family portfolio for Materials Science

The Thermo Scientific Talos (S)TEM portfolio features advanced scanning transmission electron microscopes ((S)TEMs) designed for high-resolution imaging and high-throughput materials and life sciences research. With automated workflows, intuitive Velox and AutoSTEM Software, and high-performance optics (X-TWIN, C-TWIN), Talos (S)TEMs enable fast, reproducible nanoscale analysis. Key features include a 4K Ceta camera, drift correction, and automated particle analysis, making them ideal for multi-user labs, materials characterization, and cryo-TEM applications.

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Brochure: X-CFEG for the Talos (S)TEM

The Thermo Scientific Talos (S)TEM with X-CFEG delivers high-resolution scanning transmission electron microscopy (S/TEM) for advanced nanoscale imaging and analysis. The system combines high beam current (>14 nA) and sub-0.3 eV energy resolution to support materials science, semiconductor, and life science applications, including in situ and cryo-EM workflows. Integrated automation, flexible configurations, and intuitive software enable fast, reliable, and reproducible results across diverse research environments. Designed for productivity and versatility, the Talos (S)TEM with X-CFEG supports high-throughput characterization, precise elemental analysis, and 2D/3D imaging.

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