TEM | Talos F200S | Materials Science | Scanning Transmission Electron Microscope

Versatile field emission imaging and analysis

The Thermo Scientific Talos F200S (S)TEM is a 200 kV field emission scanning transmission electron microscope that combines high-resolution STEM and TEM imaging with precise energy dispersive X-ray spectroscopy (EDS) for comprehensive nanoscale structural and compositional characterization. Its advanced electron optics and detector configuration deliver excellent image quality and analytical performance, making it an ideal choice for dynamic microscopy applications across academic, industrial, and government research environments.

The Talos F200S (S)TEM delivers strong analytical performance, high productivity, and long-term investment protection without the complexity of the highest-end platforms.

Understanding the Talos (S)TEM portfolio

The Thermo Scientific Talos (S)TEM portfolio is designed to support a wide range of materials science and analytical workflows, with each system optimized for different priorities. The Talos F200i (S)TEM focuses on productivity, flexibility, and ease of use, making it an ideal choice for multi-user laboratories and routine characterization. The Talos F200S (S)TEM builds on this foundation by adding enhanced analytical performance, improved environmental stability, and a clear upgrade path, offering an excellent balance between throughput and advanced capability. And the Talos F200X (S)TEM represents the most advanced analytical platform in the family, delivering the highest EDS performance, fastest time to chemical insight, and superior 2D and 3D compositional analysis. Together, the Talos (S)TEMs provide scalable solutions that allow laboratories to choose the right level of performance today while retaining flexibility for future needs.

Learn more about the full Talos (S)TEM portfolio

Talos F200S Scanning Transmission Electron Microscope features

Intuitive software

Powered by Thermo Scientific Velox Software, the Talos F200S (S)TEM enables fast, intuitive acquisition and analysis of multimodal data. Imaging, diffraction, and spectroscopy workflows are integrated into a single user interface, reducing setup time and enabling reproducible results across both expert and multi-user laboratories.

Precise chemical composition data

Two in-column Thermo Scientific Super-X Silicon Drift Detectors (SDDs) provide rapid, highly precise quantitative EDS analysis. The optimized detector geometry and cleanliness deliver accurate nanoscale elemental mapping, revealing critical compositional details in both 2D and 3D analytical workflows.

High-quality image data

High-throughput (S)TEM imaging with simultaneous multi-signal detection delivers improved contrast and enhanced image quality. By capturing multiple detector signals at once, the Talos F200S (S)TEM provides richer structural information and clearer visualization of complex microstructures.

Upgrade capability

The Talos F200S (S)TEM can be field upgraded to the Thermo Scientific Talos F200X (S)TEM, allowing laboratories to expand analytical performance as research demands evolve. This upgrade path protects long-term investment while minimizing system downtime.

Increased stability

An advanced instrument enclosure reduces sensitivity to air pressure waves, airflow disturbances, and minor temperature variations in the TEM room. This enhanced environmental stability ensures consistent imaging and analytical performance in real-world, multi-instrument laboratory environments.

Space for more advanced experiments

The wide objective lens gap and system design support application-specific in situ and tomography sample holders, enabling dynamic experiments such as heating, biasing, or environmental studies without compromising imaging or analytical capability.

Talos F200S (S)TEM specifications

HRTEM line resolution	0.10
HRSTEM [nm]	0.16
Total beam current FEG	> 150 nA
EDS system	2 SDD windowless design, shutter-protected
EDS energy resolution	≤ 136 eV for Mn-Kα and 10 kcps (output)
Fast EDS mapping	Pixel dwell times down to 10 μs
EDS Net solid angle	0.45 sr

Talos F200S (S)TEM resources

Watch our webinar and browse the documents below to learn more about how the Talos F200S (S)TEM can support your work.

Velox Software and Talos (S)TEM: The power duo at your service

Watch this on-demand webinar to learn how Velox Software and the Talos (S)TEM can help you efficiently acquire various types of data from your samples, including TEM and STEM images, diffraction data, and EDS data. You’ll see how to use the tools in tandem to collect and accurately analyze data from multiple sample types.