ESD Testing Systems

The Thermo Scientific MK.4TE ESD and Latch-up Test System is a complete, robust, and feature-filled turnkey instrumentation test package that performs automatic and manual HBM, MM, and latch-up tests on devices with pin counts up to 2,304 pins. Devices with higher pin counts can also be tested on the system, using either pin ganging methods allowed in the ESD test standards or through the use of multiple test fixture boards.
 

The MK.4TE Test System is a versatile, powerful, and flexible high-yield test system embraced by IC structure designers and QA program managers worldwide. It is easily upgradeable to meet evolving regulatory and quality standards. The MK.4TE Test System's advanced rapid relay-based hardware is ten times faster than mechanically driven ESD testers, with a switching matrix that allows any pin to be grounded, floated, vectored, or connected to V/I supplies. It features a fast embedded VME controller, remote access capabilities, and TCP/IP communication for data transfer. The system supports up to 2,304 channels, solid-state matrix topology, latch-up stimulus, high-voltage power source, and advanced device preconditioning and intuitive setup via Thermo Scientific Scimitar Software.

The Thermo Scientific MK.2TE ESD and Latch-up Test System is a relay-based, exceptionally fast ESD and latch-up test system used in the evaluation of advanced IC devices. It fully addresses today's JEDEC/ESDA standards and can be configured with 128, 256, 384, 512, or 768 test pins. Devices with higher pin counts can also be tested on the system using either pin ganging methods allowed in the ESD test standards or through the use of multiple test fixture boards.
 

The MK.2TE ESD and Latch-up Test System offers advanced capabilities for testing high-pin-count devices to human body model (HBM) and machine model (MM) ESD standards. Its pulse delivery design addresses waveform hazards like trailing pulses and pre-discharge voltage rise, helping to ensure accurate testing. The system includes a user-selectable 10K shunt to eliminate voltage prior to HBM events, and it performs latch-up testing per JEDEC EIA/JESD 78 Method. It features an 8-site HBM pulse source, enhanced dataset capabilities, preconditioning options, high-voltage power supply chassis, and intuitive setup via Scimitar Software.

The Thermo Scientific MK.1TE ESD and Static Latch-up Test System is a relay-based, exceptionally fast ESD and static latch-up test system used in the evaluation of advanced IC devices. It fully addresses today's JEDEC/ESDA standards and can be configured with 64, 128, 192 or 256 test pins. Devices with higher pin counts can also be tested on the system using either pin ganging methods allowed in the ESD test standards or through the use of multiple test fixture boards.
 

The MK.1TE ESD and Static Latch-up Test System offers advanced capabilities for testing midrange pin count devices to human body model (HBM) and machine model (MM) ESD standards. Its pulse delivery design addresses waveform hazards like trailing pulses and pre-discharge voltage rise, helping to ensure accurate testing. The system includes a user-selectable 10K shunt to eliminate voltage prior to HBM events and can perform static latch-up testing per JEDEC’s EIA/JESD 78 method with the optional latch-up feature. It features an 8-site HBM pulse source, enhanced dataset capabilities, high-voltage power supply chassis,  and intuitive setup via Scimitar Software.

The Thermo Scientific Orion3 Charged Device Model (CDM) Tester is a floor-standing, bench-height robotic, charged device model (CDM) tester designed to meet all popular CDM test standards, allowing both field-induced air discharge methods (FICDM) and contact methods such as the low impedance contact CDM (LI-CCDM) test method.
 

The Orion3 ESD Tester simulates the potentially destructive CDM ESD discharges that can occur during device manufacturing, helping to identify sensitive structures before full-scale production, thus saving substantial costs in time, material, and lost opportunity. High-resolution dual cameras allow easy discharge pin alignment, with simultaneous x and y axis display and continuous monitoring during tests. The system supports FICDM (air discharge) testing to industry standards, with an event detector to help ensure proper discharge and alignment. It also supports low impedance contact CDM (LI-CCDM) testing, eliminating issues seen with air discharge methods. The Orion3 ESD Tester features vacuum hold-down for various device types, ergonomic bench height, environmental monitoring, and intuitive setup via Scimitar Software.

The Thermo Scientific Celestron Test System is a two-terminal, bench-top TLP/VF-TLP test system for fast, accurate, reliable, and affordable characterization of advanced semiconductor ESD protection structures, providing detailed parametric information on the protection structure.
 

The Celestron TLP/VF-TLP Test System supports standard TLP and VF-TLP testing at wafer and package levels. Optional probes measure signals on pins or pads other than those stressed. The advanced software aids setup and displays TLP pulse voltage/current waveforms, I-V curves, and leakage current measurements. You can select test voltages, pulse polarity, and adjust measurement windows. The system includes a Microsoft Windows-based controller, high-current TLP pulse generator, +/-200 V source/meter unit, and optional bias supplies. It interfaces with semiautomatic probers and offers intuitive control and report generation, all in a compact bench-top footprint.

The Thermo Scientific Pegasus 2-Pin ESD Test System is a low-parasitic tester platform used in the evaluation of advanced IC devices at both wafer and package levels. Determination of ESD failure thresholds is made easy using one of the available ESD waveforms and built-in curve tracing capabilities.
 

The Pegasus ESD Test System is a low-parasitic, 2-pin tester for characterizing protection structures at wafer, die, or package levels. It supplements data from automated high-pin-count ESD test systems and supports human body model (HBM), machine model (MM), and human metal model (HMM) true System Level (150pF/330Ω) IEC-like waveforms. The system helps ensure waveform fidelity at the device under test, and it captures current and voltage waveforms for analysis. It features pre- and post-curve trace measurements, oscilloscope interface, automatic waveform storage and analysis, and voltage waveform capture. The compact system fits on a bench top or in a 19-inch test rack, and it interfaces with wafer probers.