Advanced (S)TEM imaging and analytical performance for versatile research and industrial applications

The Thermo Scientific Talos F200X (S)TEM is a powerful, multi-purpose scanning transmission electron microscope designed for high-resolution imaging and high-performance elemental analysis. By combining outstanding STEM resolution with advanced Super-X Detectors for energy-dispersive X-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS), the Talos F200X (S)TEM enables precise 2D and 3D chemical characterization across a wide range of materials and life science applications.

 

Integrated with Thermo Scientific Velox Software, the Talos F200X (S)TEM delivers highly accurate, repeatable results while maintaining exceptional cleanliness and ease of use. Its flexible configuration options make it an outstanding choice for both research and industrial environments that require reliable, high-quality analytical data.

 

The Talos F200X (S)TEM is designed to support demanding analytical workflows while remaining flexible enough for a wide range of applications. From materials science to industrial R&D, it provides the performance, reliability, and usability required for high-confidence results.


Understanding the Talos (S)TEM portfolio

The Thermo Scientific Talos (S)TEM portfolio is designed to support a wide range of materials science and analytical workflows, with each system optimized for different priorities. The Talos F200i (S)TEM focuses on productivity, flexibility, and ease of use, making it ideal for multi-user laboratories and routine characterization. The Talos F200S (S)TEM builds on this foundation by adding enhanced analytical performance, improved environmental stability, and a clear upgrade path, offering an excellent balance between throughput and advanced capability. And the Talos F200X (S)TEM represents the most advanced analytical platform in the family, delivering the highest EDS performance, fastest time to chemical insight, and superior 2D and 3D compositional analysis. Together, the Talos (S)TEMs provide scalable solutions that allow laboratories to choose the right level of performance today while retaining flexibility for future needs.


Talos F200X Scanning Transmission Electron Microscope features

Available with a wide range of high-resolution field emission guns (FEG)

The Talos F200X (S)TEM is available with high-brightness X-FEG or the ultra-high-brightness cold field emission gun (X-CFEG), delivering exceptional probe brightness and outstanding energy resolution. The X-CFEG combines state-of-the-art (S)TEM imaging performance with outstanding energy resolution, enabling highly sensitive analytical measurements and advanced spectroscopy. This flexibility allows users to optimize the instrument for demanding high-resolution imaging, quantitative EDS, and correlative analytical workflows.

Intuitive software for multimodal data acquisition

Thermo Scientific Velox Software provides a powerful yet intuitive platform for fast, efficient acquisition and analysis of multimodal (S)TEM data. Its streamlined user interface enables users to seamlessly combine imaging, spectroscopy, and analytical workflows within a single environment. Automated routines and guided workflows help ensure consistent results, reduce setup time, and improve productivity across both expert and multi-user laboratories.

Faster time to chemical composition

Reveal nanoscale chemical composition with speed and confidence. The four in-column Super-X SDD EDS Detectors offer rapid, precise quantitative chemical mapping with exceptional cleanliness, allowing users to acquire high-quality 2D and 3D compositional data with excellent signal-to-noise performance. Advanced detector integration and optimized system geometry support high count rates as well as accurate elemental mapping and tomography, accelerating insight while maintaining analytical precision.

Accurate image data with advanced signal detection

High-throughput STEM imaging with simultaneous, multi-signal detection delivers improved contrast and enhanced image quality. Advanced EDS and EELS capabilities enable high-speed analysis of elemental distribution and concentration, including chemical bonding information, for both heavy and light elements. By capturing multiple detector signals in parallel, the Talos F200X (S)TEM provides richer structural and compositional information in a single acquisition, supporting advanced materials characterization and high-confidence data interpretation.

Space for more advanced applications

The Talos F200X (S)TEM is designed with flexibility in mind, offering ample space to integrate application-specific in situ sample holders. This enables dynamic experiments, such as heating, biasing, or environmental studies, allowing researchers to observe structural and chemical changes in real time without compromising imaging or analytical performance.

High-quality (S)TEM images with accurate EDS quantification

Acquire high-quality TEM and STEM images using the innovative and intuitive Velox Software interface. The Talos F200X (S)TEM benefits from EDS absorption correction within Velox Software, enabling highly accurate elemental quantification, even for complex or thick samples. This helps to deliver reliable, reproducible analytical results across a wide range of materials and experimental conditions.

Highly repeatable data collection

All essential daily TEM alignments and tunings—including focus, eucentric height, beam shift, condenser aperture, beam tilt pivot points, and rotation center—are fully automated. This helps every session begin from optimal imaging conditions, enabling experiments to be repeated with high reproducibility. Researchers can focus on scientific discovery rather than routine instrument setup.

Increased productivity in demanding environments

The Talos F200X (S)TEM features an ultra-stable electron column, remote operation via the SmartCam Camera, and constant-power objective lenses that support rapid mode switching and fast high-tension (HT) changes. These capabilities enable smooth transitions between imaging and analytical modes, helping to maximize uptime and productivity—especially in high-throughput and multi-user environments.


Talos F200X (S)TEM specifications

HRTEM line resolution
  • ≤ 0.10 nm
STEM resolution
  • ≤ 0.16 nm (X-FEG)
  • ≤ 0.14 nm with 100 pA (X-CFEG)
Super-X EDS system
  • 4 SDD symmetric design, windowless, shutter-protected
Electron energy loss spectroscopy (EELS) energy resolution
  • ≤ 0.8 eV (X-FEG)
  • ≤ 0.3 eV (X-CFEG)
Gun brightness at 200 kV
  • 1.8×109 A /cm2 srad (X-FEG)
  • 2.4×109 A /cm2 srad (X-CFEG)

Talos F200X (S)TEM resources

Velox Software and Talos (S)TEM: The power duo at your service

Watch this on-demand webinar to learn how Velox Software and the Talos (S)TEM can help you efficiently acquire various types of data from your samples, including TEM and STEM images, diffraction data, and EDS data. You’ll see how to use the tools in tandem to collect and accurately analyze data from multiple sample types.

Talos F200X (S)TEM documentation

Datasheet: Talos F200X (S)TEM

Brochure: Talos (S)TEM portfolio

Brochure: X-CFEG for the Talos (S)TEM

For Research Use Only. Not for use in diagnostic procedures.