Search
Advanced Characterization Instruments and Technologies
Thermo Fisher Scientific offers a comprehensive portfolio of advanced characterization instruments and analytical technologies designed to support metals research, manufacturing, quality control, and failure analysis workflows. From high-resolution electron microscopy and spectroscopy to surface analysis, diffraction, and automated characterization solutions, our technologies help researchers and manufacturers investigate composition, microstructure, defects, interfaces, coatings, and material behavior across multiple length scales. By combining complementary analytical techniques into integrated workflows, Thermo Fisher solutions enable deeper materials insight, faster decision-making, and more efficient metals innovation across the entire supply chain.
Axia ChemiSEM System
SEM EDS instrument that is flexible, easy to use, and offers instantaneous, quantitative elemental analysis. The Thermo Scientific Axia ChemiSEM seamlessly integrates EDS data acquisition, employing concurrent signal processing algorithms for simultaneous display of sample morphology and quantitative elemental composition in real time. It continually processes EDS data in the background, providing live elemental updates as they are obtained. Users can selectively toggle elements on and off to focus on specific regions of interest within their samples.
Key features:
- High-resolution imaging at the analytical working distance.
- Versatile material analysis to support a wide range of beam-sensitive, composite, magnetic, and nano-materials
- Integrated EDS capabilities with ChemiSEM Technology enable complex, live quantitative elemental analysis in a single, streamlined process
- Productivity-boosting automation includes self-aligning optics, multiple detectors, a large multi-sample stage, and fast pump down
Apreo ChemiSEM System
Thermo Scientific Apreo ChemiSEM delivers nanometer to sub-nanometer resolution at a 10 mm analytical working distance. With a FEG source, it supports analysis of beam-sensitive, magnetic, and nano-materials. Integrated EDS enables live quantitative elemental mapping in one streamlined process. Enhanced with automated features, self-aligning optics, multi-detectors, a large stage, and fast pump down, it maximizes throughput and boosts your team's productivity.
Key features:
- High performance, resolution, and contrast
- Wide range of sample types
- Live quantitative EDS with ChemiSEM
- Quick and easy sample loading
- Advanced automation
- Performance at long working distance
Phenom ParticleX Desktop Scanning Electron Microscope
Particle characterization with desktop scanning electron microscopy for materials analysis applications. Thermo Scientific Phenom ParticleX Desktop Scanning Electron Microscope delivers a comprehensive plug-and-play SEM-EDS software solution for particle analysis workflows. Featuring automated characterization, verification, and classification of materials, the instruments support your production with fast, precise, and compliant data.
Key features:
- Fully integrated particle analysis software with SEM-EDS system
- Certified repeatability and reproducibility
- Compliance with industry standards in technical cleanliness, steel inclusion analysis, and gunshot residue analysis
- Automated, unattended long analysis run time
- Small system footprint with built-in, customizable reporting software
- Local language support and training
- Continuous updates based on the latest technology and your feedback
Talos F200X Scanning Transmission Electron Microscope
TEM microscope for high-resolution TEM and STEM results with accurate chemical quantification. The Thermo Scientific Talos F200X STEM is a scanning transmission electron microscope that combines outstanding high-resolution STEM and TEM imaging with industry-leading energy dispersive X-ray spectroscopy (EDS) signal detection. 2D/3D chemical characterization with compositional mapping is performed by 4 in-column SDD Super-X detectors with unique cleanliness. The Talos F200X scanning transmission electron microscope allows for fast and precise EDS analysis in all dimensions, along with high-resolution TEM and STEM (HRTEM and HRSTEM) imaging with fast navigation for dynamic microscopy.
Key features:
- High-resolution, EDS cleanliness, and quality in 2D as well as 3D
- X-FEG and X-CFEG available for the highest brightness and energy resolution
- High accuracy and repeatable results with integrated Thermo Scientific Velox Software
Talos F200i Scanning Transmission Electron Microscope
TEM and STEM analysis for high-throughput, high-resolution chemical characterization and dynamic observations. The Thermo Scientific Talos F200i (S)TEM is a versatile 20-200 kV field emission (scanning) transmission electron microscope tailored for diverse materials science applications. Its X-Twin pole piece gap offers exceptional flexibility, while the consistent electron column allows for high-resolution 2D/3D characterization, in-situ observations, and diffraction studies.
Key features:
- Compact design with X-TWIN objective lens
- Available with S-FEG, X-FEG, and X-CFEG
- Flexible and fast EDS options for comprehensive elemental analysis
Helios 5 Laser PFIB
Combined focused ion beam milling and laser ablation tools. The Thermo Scientific Helios 5 PFIB Laser Systems integrate plasma focused ion beam milling, femtosecond laser ablation, and SEM imaging, creating a powerful "TriBeam" setup. This configuration provides high-resolution imaging and in situ ablation, facilitating rapid millimeter-scale material characterization at nanometer-level precision.
Key features:
- Fast, millimeter-scale cross sections
- Statistically relevant deep subsurface and 3D data analysis
- Shares all capabilities of the Helios 5 PFIB platform
Scios 3 FIB-SEM
The Thermo Scientific Scios 3 FIB-SEM is a versatile, high-performance instrument for materials science, engineering, semiconductor failure analysis, and quality control labs. With ultra-high-resolution SEM imaging, reliable TEM sample preparation, automated cross-sectioning, and advanced workflows, it can handle a wide variety of sample types—including magnetic or non-conductive materials—without compromising image quality or throughput. The Scios 3 FIB-SEM combines ease of use with automation, making it a powerful tool for academic and industrial environments that demand flexibility and consistency.
Key features:
- Automated cross-section preparation and analysis
- High-throughput analytical 3D characterization
- Automated, high-quality, site-specific (S)TEM sample preparation
- High-resolution SEM imaging Designed for ease of use
X-ray Photoelectron Spectroscopy (XPS)
X-ray photoelectron spectroscopy (XPS) provides highly surface-sensitive chemical analysis for investigating elemental composition, chemical states, and surface chemistry of metals, alloys, coatings, and thin films. XPS enables researchers to better understand oxidation, corrosion, contamination, adhesion, surface treatments, and interface chemistry across a wide range of materials science and industrial manufacturing applications.
Thermo Fisher Scientific XPS solutions support both routine and advanced surface characterization workflows through high-resolution chemical analysis, depth profiling, imaging, and automated data acquisition capabilities. These workflows help researchers investigate surface modifications, coating performance, passivation layers, failure mechanisms, and chemical interactions occurring at material interfaces.
XPS is widely used in metals research and manufacturing environments for corrosion analysis, coating evaluation, contamination detection, battery materials characterization, semiconductor materials analysis, and advanced surface engineering applications where precise surface chemistry insight is critical to material performance and reliability.
For Research Use Only. Not for use in diagnostic procedures.