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Reliable results across materials science, semiconductors, and life sciences
From metals and alloys to advanced semiconductor devices and life sciences research, today’s demanding applications require precise, reliable sample preparation and high-quality imaging. The Thermo Scientific Helios 5 DualBeam FIB-SEM helps researchers address these challenges with integrated focused ion beam (FIB) technology, stable imaging performance, and guided workflows. Whether preparing site-specific TEM samples, localizing defects in complex microelectronics, or capturing 3D ultrastructural data, the system helps support consistent, high-quality results across a wide range of applications.
Metals and alloys
In situ TEM examination of metals and alloys, such as heating experiments, provide critical insights into the material’s structure, composition, and performance. However, preparing a sample for such investigation is a truly challenging task, requiring all components of the FIB-SEM to work seamlessly. The Helios 5 DualBeam’s innovative FIB technology, precise stage, and sample manipulator, backed up with Thermo Fisher Scientific’s applications expertise, turn this into a routine task.
Semiconductors and microelectronics
As the dimensions of semiconductor devices shrink and become more complex, defect localization and failure analysis become more critical—and more challenging. With structural elements such as high-density interconnects, wafer-level stacking, flexible electronics, and integral substrates, failure-inducing defects have more places to hide. The Helios 5 DualBeam’s advanced imaging and analysis capabilities, combined with automation and guided workflows, significantly enhance lab productivity and accuracy in identifying and visualizing defects.
Life sciences research
Volume electron microscopy (vEM) techniques, such as serial FIB-SEM imaging and array tomography, are powerful approaches for exploring the 3D nanostructure of cells, tissues, and small organisms. These demanding applications rely on exceptional imaging stability, precise milling, and consistent performance to capture fine ultrastructural detail. The Helios 5 DualBeam gallium FIB-SEM system combines advanced automation, guided workflows, and proven reliability to deliver the precision and reproducibility required for high-quality vEM data in life science research.
3D volumetric data from postmortem human brain tissue. Assessment of the FIB-SEM image shows excellent ultrastructural preservation of the tissue. Data captured with a Helios Hydra DualBeam and segmentation of myelin (blue), was performed using Amira Software. Image courtesy of Dr. Jill Glausier and Dr. Zachary Freyberg, University of Pittsburgh.
For Research Use Only. Not for use in diagnostic procedures.