Explore essential Helios 5 DualBeam guides, tools, and learning materials

Discover our comprehensive resources designed to help you learn faster, solve problems confidently, and stay ahead. From brochures and videos to datasheets and application notes, you’ll find actionable insights curated for beginners and pros alike. Whether you’re researching, implementing, or optimizing, our regularly updated content makes it easy to find, understand, and apply solutions—so you can achieve results with clarity and speed.


Brochures

FIB-SEM instruments for materials science

Focused ion beam combined with scanning electron microscopy.


Datasheets

Datasheet: Helios 5 CX DualBeam

Datasheet: Helios 5 UC DualBeam

Datasheet: Helios 5 UX DualBeam

Datasheet: Helios 5 HX DualBeam

Datasheet: Helios 5 FX DualBeam


Application notes

Semiconductor electrical failure analysis and semiconductor physical failure analysis

Semiconductor electrical failure analysis and semiconductor physical failure analysis

Videos

For Research Use Only. Not for use in diagnostic procedures.