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Arctis Cryo Plasma-FIB 冷冻等离子体聚焦离子束电镜

Automated plasma FIB SEM for scalable cryo-ET lamella preparation

The Thermo Scientific Arctis Cryo Plasma-FIB is a dedicated cryogenic lamella preparation system designed for automated, unattended operation in cryo-electron tomography (cryo-ET) workflows.

 

Optimized for routine operation at scale, the Arctis Cryo Plasma-FIB supports the efficient preparation of large numbers of lamellae from multiple grids, enabling cryo-ET studies that rely on robust, quantitative datasets across cellular and molecular biology.

 

By combining automation, connected workflows, correlative microscopy and multi-grid operation, Arctis Cryo Plasma-FIB supports routine cryo-ET lamella preparation at scale.

Arctis Cryo-Plasma FIB capabilities

Correlative light and electron microscopy

Integrated fluorescence light microscopy (iFLM) enables the same region of interest to be viewed with light, ion, and electron beams.

Automated multi-grid lamella preparation

The Arctis Cryo Plasma-FIB automates lamella preparation across multiple grids in a single run, enabling scalable cryo-ET operation in shared laboratories.

Cryo-ET workflow integration

See how the Arctis Cryo Plasma-FIB facilitates a connected cryo-ET workflow, from sample and lamella preparation to cryo-EM imaging.

What is cryo-electron tomography?

Discover how cryo-electron tomography facilitates 3D visualization of biological structures in their native cellular environment.

Service and support

From installation and training to ongoing service and optimization, Thermo Fisher Scientific supports your cryo FIB throughout its lifecycle.

Resources and documentation

Access datasheets, application notes, webinars, and reference materials on the Arctis Cryo Plasma-FIB and related cryo-ET workflows.

Frequently asked questions about the Arctis Cryo-PFIB

The Thermo Scientific Arctis Cryo Plasma FIB is a specialized focused ion beam scanning electron microscope (FIB-SEM) designed for the automated preparation of cryo-electron tomography (cryo-ET) samples, with the ability to produce in-situ cryo-lamellae with a thickness of 200 nm or less.  Its automation features, PFIB material removal capabilities, and ability to load up to 12 samples at once help the Arctis Cryo-PFIB achieve substantially greater throughput than conventional gallium-based FIB systems.

Thin, electron-transparent samples (lamellae) free from contamination and ice crystals are critical for the acquisition of high-resolution cryo-tomograms, as the sample must be thin enough for the electron beam to pass through. A uniform lamella thickness is crucial since the effective sample thickness increases with tilt angle during tomography.

 

The ability of the Arctis Cryo Plasma-FIB to prepare high-quality lamellae is supported by access to different milling ion species (xenon, argon, and oxygen), which can even be used in sequence to further enhance sample preparation. Additionally, the lower-volume sample chamber and dedicated cryo-box allow a clean working environment to be maintained for multiple days by reducing water condensation and ice buildup.

Beyond the versatile multi-ion plasma FIB, the Arctis Cryo-PFIB features several critical technologies that enhance its sample preparation capabilities. This includes a Schottky field emission gun SEM and integrated fluorescence microscope (iFLM), which support sample navigation, targeting of regions of interest, and precise end-pointing for cryo-lamella preparation.

 

The Arctis Cryo-PFIB incorporates a gas injection system (GIS) and a retractable in-chamber sputter target, which enable the deposition of protective platinum layers, as well as coatings for improved sample conductivity during cryo-tomography. Having this capability within the FIB-SEM means that the sample does not need to be transferred to an external coater, significantly reducing the potential for sample damage and contamination.

The Arctis Cryo-PFIB has a number of automation and connectivity enhancements that support its integration into broader cryo-EM workflows. This includes a CompuStage for precise and stable sample handling, which is linked to an Autoloader (a robotic sample-handling device capable of loading and storing up to 12 vitrified grids under cryogenic conditions). With a Thermo Scientific Vacuum Capsule, these 12 grids can also be safely transferred from the Arctis Cryo-PFIB to Thermo Scientific Krios or Glacios Cryo-TEMs, minimizing the potential for sample damage and contamination.

 

Once samples are loaded into the Arctis Cryo-PFIB, lamella production processes can be set up remotely from a web-based control interface. You can batch-screen grids, perform correlative imaging (using the integrated fluorescence light microscope), and set up automated lamella preparation for multiple sites on multiple grids. 

 

The Arctis Cryo-PFIB also utilizes Thermo Scientific TomoGrid Sample Carriers, which have been specifically designed for cryo-ET workflows and keep cryo-lamellae correctly aligned to the tomographic tilt axis of cryo-TEMs. TomoGrid Carriers can be used with existing AutoGrid-based Autoloader systems; however, a calibration/alignment is required to verify compatibility with each system.

For Research Use Only. Not for use in diagnostic procedures.