Cryo-FIB | Arctis Cryo-Plasma FIB SEM Resources | Thermo Fisher Scientific

Arctis Cryo-PFIB documentation and reference material

The Arctis Cryo Plasma-FIB is a focused ion beam scanning electron microscope (FIB-SEM) designed for the automated, reliable preparation of cryo-lamellae for cryo-electron tomography (cryo-ET) experiments. This page brings together documentation, webinars, and other reference materials about this instrument and its ability to streamline cryo-ET workflows.

Featured webinars

Explore on-demand webinars that highlight the automated lamella preparation and connected cryo-ET workflows enabled by the Arctis Cryo Plasma-FIB. These presentations cover system design, collaborative development, and practical implementation in research and core facility environments.

For additional presentations related to cryo-ET, visit our webinar library

Webinar: Streamlining cryo-EM workflows

See how the Arctis Cryo Plasma-FIB, together with a range of connected technologies from Thermo Fisher Scientific, supports automated lamella preparation for cryo-ET and single-particle-analysis workflows.

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Technical documentation

A selection of technical documentation describing the system specifications and capabilities of the Arctis Cryo-PFIB.

Arctis Cryo-PFIB brochure

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Arctis Cryo-PFIB datasheet

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Associated systems, workflows, and components

Explore systems, technologies, and workflows that integrate with the Arctis Cryo Plasma-FIB, including correlative imaging technologies, transfer solutions, and software tools that support connected cryo-ET workflows.

iFLM Correlative System

Download datasheet

Vacuum Capsule for cryo-ET

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Cryo-ET for cells & organelles

Download eBook

CryoTomo Software Suite

Download datasheet

Arctis Cryo Plasma-FIB for biosafety laboratories

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Choose the right cryo-FIB for your lab

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Customer stories

Hear first-hand perspectives from Arctis Cryo Plasma-FIB users, and see how they’re leveraging cryo-FIB milling and cryo-electron tomography to answer pressing scientific questions.

"One of the things that I find exciting about Arctis [Cryo-PFIB] is the degree to which it is an automated workflow. And so, this ability to have it running essentially unsupervised and produce high quality, large numbers of lamella is transformational."

Jim Naismith

Former Director of The Rosalind Franklin Institute and key collaborator on the development of the Arctis Cryo Plasma-FIB.

Electron microscopy resources

Visit our Electron Microscopy Resource Center to access educational materials, technical articles, and updates on electron microscopy workflows and applications.