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Helios 5 PFIB DualBeam Resources

Practical Resources for Plasma FIB-SEM Workflows

Explore the Thermo Scientific Helios 5 PFIB DualBeam resource library for practical, application-focused content to help you move faster, from gallium-free plasma FIB-SEM sample preparation to high-throughput milling, 3D analysis, and semiconductor deprocessing. Find brochures, datasheets, application notes, videos, and webinars to support method selection, workflow setup, and performance optimization.

Brochures

FIB-SEM instruments for materials science

Focused ion beam combined with scanning electron microscopy.

Datasheets

Datasheet: Helios 5 PFIB CXe DualBeam (for materials science research)

Datasheet: Helios 5 PFIB UXe DualBeam (for semiconductor analysis)

Software & Accessories datasheets

Auto Slice & View 5 Software datasheet

AutoTEM 5 Software datasheet

Application notes

Failure Analysis of Wide Bandgap Power Devices

FIB TEM Sample Preparation for in situ Heating in TEM

Large area automated sample preparation for batteries

Posters

Poster: Simplifying failure analysis with plasma-FIB

Videos

For Research Use Only. Not for use in diagnostic procedures.