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Explore electron microscopy instruments and live demonstrations

Each NanoPort Electron Microscopy Facilities features a mix of instruments and expert staff who can provide demonstrations and answer any questions you may have. We routinely install new instruments, so check back to see what’s changed.

Broad ion beam polisher

CleanMill Broad Ion Beam System

The Thermo Scientific CleanMill Broad Ion Beam System polishes samples, including beam- and air-sensitive materials, for optimal imaging and analysis in materials science and semiconductor applications that require a pristine surface.

Installed at:

  • Eindhoven
  • Hillsboro

Circuit edit systems

Centrios HX Circuit Edit System

The Thermo Scientific Centrios HX Circuit Edit System offers advanced front- and backside edit capabilities with outstanding edit control, precision, and stability.

Installed at:

  • Taiwan

Electrical failure analysis systems

ELITE System

The Thermo Scientific ELITE System delivers lock-in IR thermography for accurate defect localization in semiconductor devices.

 

Installed at:

  • Shanghai
  • Tokyo

Focused ion beam scanning electron microscopes

Aquilos 2 FIB-SEM

The Thermo Scientific Aquilos 2 FIB-SEM is a cryo-EM sample preparation tool with extended run time and enhanced automation for life sciences applications.

Installed at:

  • Eindhoven
  • Shanghai

Arctis Cryo-PFIB

The Thermo Scientific Arctis Cryo-PFIB delivers automated, high-throughput cryo-lamellae production from vitrified cells and an Autoloader system that provides a direct connection between cryo-FIB-SEM sample preparation and cryo-TEM within the life sciences tomography workflow.

Installed at:

  • Eindhoven
  • Hillsboro

Helios 5 CX FIB-SEM

The Thermo Scientific Helios 5 CX FIB-SEM offers sample preparation for TEM, STEM, and atom probe tomography. Its advanced automation supports high-quality subsurface characterization in materials science, life sciences, and semiconductor analysis.

Installed at:

  • Shanghai

Helios 5 Laser PFIB

The Thermo Scientific Helios 5 Laser PFIB combines focused ion beam milling with femtosecond laser ablation and scanning electron microscopy imaging for materials science and semiconductor analysis.

Installed at:

  • Eindhoven
  • Giheung
  • Hillsboro

Helios 5 FX FIB-SEM

The Thermo Scientific Helios 5 FX FIB-SEM offers sample preparation for TEM, STEM, and atom probe tomography. Its advanced automation supports high-quality subsurface characterization in materials science, life sciences, and semiconductor analysis.

Installed at:

  • Hillsboro

Helios 5 HX FIB-SEM

The Thermo Scientific Helios 5 HX FIB-SEM offers sample preparation for TEM, STEM, and atom probe tomography. Its advanced automation supports high-quality subsurface characterization in materials science, life sciences, and semiconductor analysis.

Installed at:

  • Giheung

Helios 5 PXL Wafer PFIB-SEM

The Thermo Scientific Helios 5 PXL Wafer PFIB-SEM delivers high-aspect-ratio through-stack metrology and structural verification for full-wafer analysis.

Installed at:

  • Eindhoven
  • Hillsboro
  • Taiwan

Helios 5 UC FIB-SEM

The Thermo Scientific Helios 5 UC FIB-SEM offers sample preparation for TEM, STEM, and atom probe tomography. Its advanced automation supports high-quality subsurface characterization in materials science, life sciences, and semiconductor analysis.

Installed at:

  • Eindhoven

Helios 5 UX FIB-SEM

The Thermo Scientific Helios 5 UX FIB-SEM offers sample preparation for TEM, STEM, and atom probe tomography. Its advanced automation supports high-quality subsurface characterization in materials science, life sciences, and semiconductor analysis.

Installed at:

  • Eindhoven
  • Hillsboro
  • Shanghai

Helios 5 UXe PFIB

The Thermo Scientific Helios 5 UXe PFIB offers TEM sample preparation, 3D characterization, cross sectioning, and micromachining for materials science and semiconductor analysis.

Installed at:

  • Shanghai

Helios 6 HD FIB-SEM

The Thermo Scientific Helios 6HD FIB-SEM delivers high volumes of high-quality TEM data for semiconductor failure analysis and metrology.

Installed at:

  • Eindhoven
  • Hillsboro
  • Shanghai
  • Taiwan 

Helios Hydra FIB-SEM

The Thermo Scientific Helios Hydra FIB-SEM offers multiple ion species for 3D EM and TEM sample preparation in materials science, life sciences, and semiconductor analysis.

Installed at:

  • Shanghai
  • Tokyo 

Helios Hydra UX PFIB

The Thermo Scientific Helios Hydra UX PFIB offers multiple ion species for 3D EM and TEM sample preparation for materials science and semiconductor analysis.

Installed at:

  • Eindhoven
  • Hillsboro
  • Tokyo

Hydra Bio PFIB

The Thermo Scientific Hydra Bio PFIB delivers versatile lamella preparation for life sciences volume electron microscopy and cryo-tomography.

Installed at:

  • Hillsboro

Scios 2 FIB-SEM

The Thermo Scientific Scios 2 FIB-SEM delivers ultra-high-resolution, high-quality sample preparation and 3D characterization for materials science, life sciences, and semiconductor analysis.

Installed at:

  • Shanghai

Scios 3 FIB-SEM

The Thermo Scientific Scios 3 FIB-SEM delivers ultra-high-resolution, high-quality sample preparation and 3D characterization for materials science, life sciences, and semiconductor analysis.

Installed at:

  • Eindhoven
  • Hillsboro 

Scanning electron microscopes

Apreo 2 SEM

The Thermo Scientific Apreo 2 SEM offers versatile, high-performance imaging and analysis for materials science, life sciences, and semiconductor analysis.

Installed at:

  • Eindhoven
  • Giheung
  • Shanghai

Apreo ChemiSEM System

The Thermo Scientific Apreo 
ChemiSEM System offers versatile, high-performance imaging and analysis for materials science, life sciences, and semiconductor analysis.

Installed at:

  • Eindhoven
  • Hillsboro

Axia ChemiSEM System

The Thermo Scientific Axia ChemiSEM System combines SEM and EDS into a flexible, easy-to-use instrument and delivers instantaneous quantitative elemental analysis for materials science.

Installed at:

  • Eindhoven
  • Giheung
  • Hillsboro
  • Shanghai
  • Taiwan

Phenom XL G2 Desktop SEM

The Thermo Scientific Phenom XL G2 Desktop SEM offers a larger chamber to accommodate materials science samples up to 100 mm x 100 mm for industrial research and failure analysis.

Installed at:

  • Hillsboro

Quattro ESEM

The Thermo Scientific Quattro Environmental SEM makes it possible to study materials science, life sciences, and semiconductor samples in their natural state under controlled conditions.

Installed at:

  • Eindhoven
  • Hillsboro
  • Shanghai

Verios 5 HP SEM

The Thermo Scientific Verios 5 HP SEM can help you characterize semiconductor and materials science nanomaterials with sub-nanometer resolution and high material contrast.

Installed at:

  • Giheung
  • Hillsboro 

Volumescope 2 SEM

The Thermo Scientific Volumescope 2 SEM offers 3D imaging of large-volume samples with serial block face imaging and multi-energy deconvolution of life sciences.

Installed at:

  • Hillsboro

Transmission electron microscopes

Glacios 2 Cryo-TEM

The Thermo Scientific Glacios 2 Cryo-TEM simplifies sample optimization and high-resolution data acquisition for life sciences applications.

Installed at:

  • Eindhoven
  • Hillsboro
  • Shanghai

Krios G4 Cryo-TEM

The Thermo Scientific Krios G4 Cryo-TEM offers atomic-resolution cryo-EM with enhanced productivity and a compact design for life sciences applications.

Installed at:

  • Eindhoven

Spectra 300 TEM

The Thermo Scientific Spectra 300 TEM offers high-resolution TEM and STEM for materials science and semiconductor analysis.

Installed at:

  • Eindhoven
  • Shanghai

Spectra Ultra (S)TEM

The Thermo Scientific Spectra Ultra (S)TEM offers high-resolution TEM and STEM for materials science and semiconductor analysis.

Installed at:

  • Eindhoven
  • Hillsboro 

Talos 12 TEM

The Thermo Scientific Talos 12 TEM provides sample screening and high-contrast TEM and STEM imaging of beam-sensitive materials for materials science, life sciences, and semiconductor analysis.

Installed at:

  • Hillsboro

Talos F200E TEM

The Thermo Scientific F200E TEM delivers 200 kV TEM and STEM for repeatable, high-volume analysis of a broad range of semiconductor and microelectronic devices as well as materials science samples.

Installed at:

  • Shanghai

Talos F200i TEM

The Thermo Scientific Talos F200i TEM offers TEM and STEM analysis for high-throughput, high-resolution chemical characterization and dynamic observations for materials science and semiconductor analysis.

Installed at:

  • Shanghai

Talos F200X TEM

The Thermo Scientific Talos F200X TEM delivers high-resolution TEM and STEM with accurate chemical quantification.

Installed at:

  • Eindhoven
  • Hillsboro
  • Tokyo

Talos L120C

The Thermo Scientific Talos 12 TEM is designed for sample screening and high-contrast TEM and STEM imaging for both 2D and 3D applications.

Installed at:

  • Eindhoven
  • Shanghai 

Tundra Cryo-TEM

The Thermo Scientific Tundra Cryo-TEM is a dedicated structural analysis instrument for life sciences applications designed to bring cryo-EM to your laboratory at an affordable price point.

Installed at:

  • Eindhoven
  • Hillsboro
  • Shanghai

Vitrification system

Vitrobot MK IV System

The Thermo Scientific Vitrobot MK IV System delivers reproducible vitrification for biological samples.

Installed at:

  • Eindhoven
  • Hillsboro 

X-ray photoelectron spectrometers

ESCALAB QXi XPS Microprobe

The Thermo Scientific ESCALAB QXi XPS Microprobe offers multi-technique surface analysis with high-resolution X-ray photoelectron spectroscopy and imaging for materials science and semiconductor analysis.

Installed at:

Nexsa G2 Surface Analysis System

The Thermo Scientific Nexsa G2 Surface Analysis System offers automated surface analysis and multi-technique capabilities for materials science and semiconductor analysis.

Installed at:

Instruments by location

Broad ion beam polisher

  • CleanMill Broad Ion Beam System

FIB-SEMs

  • Aquilos 2 FIB-SEM
  • Arctis Cryo-PFIB
  • Helios 5 Laser PFIB 
  • Helios 5 PXL Wafer FIB-SEM
  • Helios 5 UC FIB-SEM
  • Helios 5 UX FIB-SEM
  • Helios 6 HD FIB-SEM
  • Helios Hydra UX FIB-SEM
  • Scios 3 FIB-SEM

Sample vitrification system

  • Vitrobot MK IV System

SEMs

  • Apreo 2 SEM
  • Apreo ChemiSEM System
  • Axia ChemiSEM System
  • Quattro ESEM

TEMs

  • Glacios 2 Cryo-TEM
  • Krios G4 Cryo-TEM
  • Tundra Cryo-TEM
  • Spectra 300 TEM
  • Spectra Ultra (S)TEM
  • Talos F200X TEM
  • Talos L120C TEM

East Grinstead location

  • Nexsa G2
  • Escalab QXi
  • Hypulse

FIB-SEMs

  • Helios 5 HX FIB-SEM
  • Helios 5 Laser PFIB

SEMs

  • Apreo 2 SEM
  • Axia ChemiSEM System
  • Verios 5 HP SEM

Additional equipment

  • 3D printer
  • Argon beam sample surface cleaner
  • High-end workstations
  • Optical microscopes
  • Plasma cleaner
  • Thin film coater

Broad ion beam polisher

  • CleanMill Broad Ion Beam System

FIB-SEMs

  • Helios 5 FX FIB-SEM
  • Helios 5 Laser PFIB
  • Helios 5 PXL FIB-SEM
  • Helios 5 UX FIB-SEM
  • Helios 6 HD FIB-SEM
  • Helios Hydra UX FIB-SEM
  • Hydra Bio PFIB
  • Scios 3 FIB-SEM

Sample vitrification system

  • Vitrobot MK IV System

SEMs

  • Apreo ChemiSEM System
  • Axia ChemiSEM System
  • Phenom XL G2 Desktop SEM
  • Quattro ESEM
  • Verios 5 HP SEM
  • Volumescope 2 SEM

Ridhardson location

  • nProber 5 HP
  • nProber IV HP

TEMs

  • Arctis Cryo-PFIB
  • Glacios 3 Cryo-TEM
  • Spectra Ultra (S)TEM
  • Talos 12 TEM
  • Talos F200X TEM
  • Tundra Cryo-TEM

XPS instruments

  • Nexsa G2 Surface Analysis System

Electrical failure analysis systems

  • ELITE System

FIB-SEMs

  • Aquilos 2 FIB-SEM
  • Helios 5 CX FIB-SEM
  • Helios 5 UX FIB-SEM
  • Helios 5 UXe PFIB
  • Helios 6 HD FIB-SEM
  • Helios Hydra FIB-SEM
  • Scios 2 FIB-SEM

SEMs

  • Axia ChemiSEM System
  • Apreo 2 SEM
  • Quattro ESEM

TEMs

  • Glacios 2 Cryo-TEM
  • Spectra 300 TEM
  • Talos F200E TEM
  • Talos F200i TEM
  • Talos L120C TEM
  • Tundra Cryo-TEM

XPS instruments

  • ESCALAB QXi Microprobe
  • Nexsa G2 Surface Analysis System

Circuit edit systems

  • Centrios HX Circuit Edit System

FIB-SEMs

  • Helios 5 PXL Wafer FIB-SEM
  • Helios 6 HD FIB-SEM

SEMs

  • Axia ChemiSEM System

Electrical failure analysis systems

  • ELITE System

FIB-SEMs

  • Helios 5 UX FIB-SEM
  • Helios Hydra FIB-SEM

TEMs

  • Talos F200X TEM

XPS instruments

  • Nexsa G2 Surface Analysis System

For Research Use Only. Not for use in diagnostic procedures.